Highlights

• It is mainly used for testing the DC parameters of manifold semiconductors such as diode, transistor, controlled silicon and field effect transistor.It also can be used to test the with stand voltage
• Measuring forward voltage, reverse voltage, forward saturation voltage drop, amplification factor, reverse leakage current of various crystal diode, audion, silicon controlled rectifier(SCR), field ef
• Measuring rated working voltage of chemical capacitor, terylene capacitor, capacitor, Leaded multilayer ceramic capacitor, high voltage lacker.
• Measuring protection voltage of varistor.
• Data hold, low battery warning.

Key Attributes

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